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Ni Circuit Design Suite 11 0 Education Serial Number: What You Need to Know About System Tags and Li



The word 'keygen' means a small program that can generate a cd key, activation number, license code, serial number, or registration number for a piece of software. KeyGen is a shortened word for Key Generator.




Ni Circuit Design Suite 11 0 Education Serial Number



NI Multisim & Ultiboard Circuit Design Suite v11 0 1 - Registered NI Multisim & Ultiboard With powerful learning features and laboratory hardware integration, Multisim teaches students foundational concepts in analog, digital, and power electronics throughout engineering and science curriculum. Multisim Student Edition to understand analog, digital, and power electronics in homework and projects. Multisim simulation and circuit design software gives engineers the advanced analysis and design capabilities to optimize performance, reduce design errors, and shorten time to prototype. Intuitive NI tools result in saved printed circuit board (PCB) iterations and significant cost savings.


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Abstract:In aerospace environments, high reliability and low power consumption of chips are essential. To greatly reduce power consumption, the latches of a chip need to enter the power down operation. In this operation, employing non-volatile (NV) latches can retain circuit states. Moreover, a latch can be hit by a radiative particle in the aerospace environment, which can cause a severe soft error in the worst case. This paper presents a NV-latch based on resistive random-access memories (ReRAMs) for NV and robust applications. The proposed NV-latch is radiation-hardened with low overhead and can restore values after power down operation. Simulation results demonstrate that the proposed NV-latch can completely provide radiation hardening capability against single-event upsets (SEUs) and can restore values after power down operation. The proposed NV-latch can reduce the number of transistors in the storage cells by 50% on average compared with the other similar solutions.Keywords: resistive random-access memory; non-volatile; circuit reliability; latch design; single-event upset


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